HP 4500 ICP MS System

HP 4500 ICP MS

Background Information:

Inductively coupled plasma mass spectrometry (ICP-MS) is an analytical technique that performs elemental analysis with excellent sensitivity and high sample throughput. The ICP-MS instrument employs a plasma (ICP) as the ionization source and a mass spectrometer (MS) analyzer to detect the ions produced. It can simultaneously measure most elements in the periodic table and determine analyte concentration down to the subnanogram-per-liter or part-per-trillion (ppt) level. It can perform qualitative, semiquantitative, and quantitative analysis and compute isotopic ratios.

The schematic diagram of an ICP-MS instrument is shown in Fig. 1.

How it works:

Basically, liquid samples are introduced by a peristaltic pump to the nebulizer where a sample aerosol is formed. A double-pass spray chamber ensures that a consistent aerosol is introduced to the plasma. Argon (Ar) gas is introduced through a series of concentric quartz tubes, known as the ICP torch.

The torch is located in the center of an RF coil, through which 27.12-MHz RF energy is passed. The intense RF field causes collisions between the Ar atoms, generating a high-energy plasma. The sample aerosol is instantaneously decomposed in the plasma (plasma temperature is in the order of 6,000 to 10,000K) to form analyte atoms, which are simultaneously ionized.

The ions produced are extracted from the plasma into the mass spectrometer region, which is held at high vacuum (typically 10–6 Torr, 10–4 Pa). The vacuum is maintained by differential pumping.

The analyte ions are extracted through a pair of orifices, approximately 1 mm in diameter, known as the sampling cone and the skimmer cone. The analyte ions are then focused by a series of ion lenses into a quadrupole mass analyzer which separates the ions based on their mass/charge ratio (m/z). The term quadrupole is used because the mass analyzer is essentially four parallel molybdenum rods to which a combination of RF and dc voltages is applied. The combination of these voltages allows the analyzer to transmit only ions of a specific mass/charge ratio. Finally, the ions are measured using an electron multiplier, and data at all masses is collected by a counter. The mass spectrum generated is extremely simple.

Each elemental isotope appears at a different mass (e.g. 27Al would appear at 27 amu) with a peak intensity directly proportional to the initial concentration of that isotope. The system also provides isotopic ratio information

The HP 4500 was the world’s first benchtop ICP-MS.

The HP 4500 is smaller and lighter so that it can be installed on an existing bench. The layout of the instrument is designed to make user interaction with the sample introduction system, the interfaces, and the ion lenses routine. All parts can be accessed from the front and connected or disconnected easily. These and other new features and technology introduced and used by the HP 4500 help to make ICP-MS a more routine and therefore a more accessible technique.

Ion Lens System

The configuration of the ion lens system is one of the key design issues because it directly affects the ion transmission efficiency of an ICP-MS system. Various ion lens configurations were produced and evaluated to determine the optimum configuration and operating conditions for the HP 4500. Ion trajectories through each ion lens system were predicted mathematically.

The HP 4500 is equipped with a new type of optics system. The omega lens consists of a pair of crescent-shaped lenses that resemble the Greek letter. The optics system contains two omega lenses, the omega+ and omega– lenses, which bend the ion beam, allowing the quadrupole and detector to be mounted off-axis. This prevents photons from reaching the detector (which would increase random background noise), and also focuses the ions very efficiently. The result is a very low random background and high sensitivity, making ultra-trace analysis down to the subnanogram-per-liter level feasible. In contrast, other ICP-MS systems employ a photon stop lens system

Ions are defocused after extraction into the main vacuum chamber and then refocused, while photons are blocked. The reduction in instrument size is dramatic: the size of the previous model is 1550 by 900 by 1450 mm, while that of the HP 4500 is 1100 by 600 by 582 mm. Previous generations of ICP-MS instruments had requirements—space, utilities, and
environment—that dictated that a special room be dedicated for the instrument. Installing an ICP-MS could be particularly difficult, since major construction changes were often required. Since the 4500 was the first benchtop unit, this is no longer the case.

So, long story short, the 4500 is an excellent high resolution / sensitivity solution for the cost conscious laboratory that doesn't want to sacrifice on analytical capability!

Count on GMI to be your partner for ICP MS !

The HP 4500 was the first benchtop ICP-MS. It has a new type of optics system that results in a very low random background and high sensitivity, making analysis down to the subnanogram-per-liter
(parts-per-trillion) level feasible. It can be and is often equipped with HP’s 'ShieldTorch' system, which reduces interference from polyatomic
ions.

As a benchtop unit, your purchase of a 4500 will require far less infrastructure cost when you budget for facilities costs to support this instrument.

GMI has a factory trained Agilent / HP ICP engineer on staff so you know your purchase and installation will go smoothly.

GMI sells ICP MS systems !

$ Ordering Information

Ready to buy this instrument, obtain a quotation, or learn more about what a HP 4500 or 7500 ICP MS can do for you?

Please click here & fill out our contact page
or contact our knowledgeable sales consultants at 763-712-8717 / 800-745-2710 for more information and a pre-sales consult.

ICP-MS is a relatively new analytical technique that performs elemental analysis with remarkable sensitivity and offers considerable advantages over more established techniques. In ICP-MS, liquid samples are atomized and then ionized in a high temperature plasma (ICP). The resulting ions pass into a mass spectrometer (MS) analyzer where they are detected and measured. It is 100 to 1000 times more sensitive than competing techniques, and can simultaneously measure most elements in the periodic table and determine analyte concentration down to the part-per trillion (ppt) level. It can perform qualitative, semiquantitative, and quantitative analysis, and also measure isotope ratios. A full sample analysis takes approximately 3 minutes.

"The wide dynamic range of ICP-MS," the researchers write, "measures concentrations ranging from ppm to ppt with great ease and accuracy, reducing the need for multiple runs down to a single assay. The sensitivity of ICP-MS is so high that only very small amounts of sample are required to obtain a complete trace metal characterization including isotopic ratio information. Indeed," they continue, "detection levels have become so low that the limits of detection are no longer defined by the instrument but by the impurities present in the reagents and containers"

Another unique advantage of ICP-MS is that the operator does not require a priori knowledge of the elements present in the sample. The instrument can provide a complete qualitative analysis in a single run. Once all the elements have been identified, the analyst can concentrate on quantifying those elements that will provide the most significant information.

When you purchase an instrument from GMI, you not only get consultative sales support before you purchase, but, GMI includes installation and a warranty!

Fig. 1 Schematic of the 4500 layout


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